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esp-idf
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components
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fatfs
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test_apps
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sdcard
Adam Múdry 976644acf6 CI: fix sdcard fatfs test_apps format timeout 2 years ago
..
main 976644acf6 CI: fix sdcard fatfs test_apps format timeout 2 years ago
CMakeLists.txt ac830e04ac fatfs: migrate unit tests to component test app, re-enable test for C2 3 years ago
README.md 83d0181a2c sdspi: h2 support 3 years ago
partitions.csv ac830e04ac fatfs: migrate unit tests to component test app, re-enable test for C2 3 years ago
pytest_fatfs_sdcard.py 976644acf6 CI: fix sdcard fatfs test_apps format timeout 2 years ago
sdkconfig.ci.default ac830e04ac fatfs: migrate unit tests to component test app, re-enable test for C2 3 years ago
sdkconfig.ci.psram ac830e04ac fatfs: migrate unit tests to component test app, re-enable test for C2 3 years ago
sdkconfig.ci.release ac830e04ac fatfs: migrate unit tests to component test app, re-enable test for C2 3 years ago
sdkconfig.defaults ac830e04ac fatfs: migrate unit tests to component test app, re-enable test for C2 3 years ago

README.md

Supported Targets ESP32 ESP32-C2 ESP32-C3 ESP32-C6 ESP32-H2 ESP32-S2 ESP32-S3

This test app runs a few FATFS test cases in a FAT-formatted SD card.

These tests require a development board with an SD card slot:

  • ESP32-WROVER-KIT
  • ESP32-S2 USB_OTG
  • ESP32-C3-DevKit-C with an SD card breakout board

The test cases are split between [sdmmc] and [sdspi]. Only a few tests are executed for sdspi, though. The app could be refactored to ensure that a similar set of tests runs for sdmmc and sdspi.

See ../README.md for more information about FATFS test apps.