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- /*
- Copyright (C) 2006 Yangli Hector Yee
- Copyright (C) 2006 Red Hat, Inc.
- This program is free software; you can redistribute it and/or modify it under the terms of the
- GNU General Public License as published by the Free Software Foundation; either version 2 of the License,
- or (at your option) any later version.
- This program is distributed in the hope that it will be useful, but WITHOUT ANY WARRANTY;
- without even the implied warranty of MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE.
- See the GNU General Public License for more details.
- You should have received a copy of the GNU General Public License along with this program;
- if not, write to the Free Software Foundation, Inc., 51 Franklin Street, Suite 500, Boston, MA 02110-1335, USA
- */
- #ifndef _PDIFF_H
- #define _PDIFF_H
- #include <cairo.h>
- typedef int bool;
- #ifndef true
- #define true 1
- #endif
- #ifndef false
- #define false 0
- #endif
- /* Image comparison metric using Yee's method (and a cairo interface)
- * References: A Perceptual Metric for Production Testing, Hector Yee, Journal of Graphics Tools 2004
- */
- int
- pdiff_compare (cairo_surface_t *surface_a,
- cairo_surface_t *surface_b,
- double gamma,
- double luminance,
- double field_of_view);
- #endif
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