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@@ -694,3 +694,437 @@ TEST_CASE("WP input works in SPI mode", "[sd][test_env=UT_T1_SPIMODE]")
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sd_test_board_power_off();
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}
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#endif //WITH_SDSPI_TEST
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+
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+#if WITH_SD_TEST || WITH_EMMC_TEST
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+
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+#define PATTERN_SEED 0x12345678
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+#define FLAG_ERASE_TEST_ADJACENT (1 << 0)
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+#define FLAG_VERIFY_ERASE_STATE (1 << 1)
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+bool do_sanitize_flag = false;
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+static void ensure_sector_written(sdmmc_card_t* card, size_t sector,
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+ uint8_t *pattern_buf, uint8_t *temp_buf)
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+{
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+ size_t block_size = card->csd.sector_size;
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+ TEST_ESP_OK(sdmmc_write_sectors(card, pattern_buf, sector, 1));
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+ memset((void *)temp_buf, 0x00, block_size);
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+ TEST_ESP_OK(sdmmc_read_sectors(card, temp_buf, sector, 1));
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+ check_buffer(PATTERN_SEED, temp_buf, block_size / sizeof(uint32_t));
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+}
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+
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+static void ensure_sector_intact(sdmmc_card_t* card, size_t sector,
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+ uint8_t *pattern_buf, uint8_t *temp_buf)
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+{
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+ size_t block_size = card->csd.sector_size;
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+ memset((void *)temp_buf, 0x00, block_size);
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+ TEST_ESP_OK(sdmmc_read_sectors(card, temp_buf, sector, 1));
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+ check_buffer(PATTERN_SEED, temp_buf, block_size / sizeof(uint32_t));
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+}
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+
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+static int32_t ensure_sector_erase(sdmmc_card_t* card, size_t sector,
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+ uint8_t *pattern_buf, uint8_t *temp_buf)
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+{
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+ size_t block_size = card->csd.sector_size;
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+ memset((void *)temp_buf, 0, block_size);
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+ TEST_ESP_OK(sdmmc_read_sectors(card, temp_buf, sector, 1));
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+ return memcmp(pattern_buf, temp_buf, block_size);
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+}
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+
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+static void do_single_erase_test(sdmmc_card_t* card, size_t start_block,
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+ size_t block_count, uint8_t flags, sdmmc_erase_arg_t arg)
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+{
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+ size_t block_size = card->csd.sector_size;
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+ uint8_t *temp_buf = NULL;
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+ uint8_t *pattern_buf = NULL;
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+ size_t end_block = (start_block + block_count - 1);
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+
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+ /*
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+ * To ensure erase is successful/valid
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+ * selected blocks after erase should have erase state data pattern
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+ * data of blocks adjacent to selected region should remain intact
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+ */
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+ TEST_ESP_OK((start_block + block_count) > card->csd.capacity);
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+
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+ pattern_buf = (uint8_t *)heap_caps_malloc(block_size, MALLOC_CAP_DMA);
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+ TEST_ASSERT_NOT_NULL(pattern_buf);
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+ temp_buf = (uint8_t *)heap_caps_malloc(block_size, MALLOC_CAP_DMA);
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+ TEST_ASSERT_NOT_NULL(temp_buf);
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+
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+ // create pattern buffer
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+ fill_buffer(PATTERN_SEED, pattern_buf, block_size / sizeof(uint32_t));
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+
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+ // check if it's not the first block of device & write/read/verify pattern
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+ if ((flags & FLAG_ERASE_TEST_ADJACENT) && start_block) {
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+ ensure_sector_written(card, (start_block - 1), pattern_buf, temp_buf);
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+ }
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+
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+ ensure_sector_written(card, start_block, pattern_buf, temp_buf);
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+
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+ // check if it's not the last block of device & write/read/verify pattern
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+ if ((flags & FLAG_ERASE_TEST_ADJACENT) && (end_block < (card->csd.capacity - 1))) {
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+ ensure_sector_written(card, (end_block + 1), pattern_buf, temp_buf);
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+ }
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+
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+ // when block count is 1, start and end block is same, hence skip
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+ if (block_count != 1) {
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+ ensure_sector_written(card, end_block, pattern_buf, temp_buf);
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+ }
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+
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+ // fill pattern to (start_block + end_block)/2 in the erase range
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+ if(block_count > 2) {
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+ ensure_sector_written(card, (start_block + end_block)/2, pattern_buf, temp_buf);
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+ }
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+
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+ float total_size = (block_count/1024.0f) * block_size;
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+ printf(" %10d | %10d | %8.1f ", start_block, block_count, total_size);
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+ fflush(stdout);
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+
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+ // erase the blocks
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+ struct timeval t_start_er;
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+ gettimeofday(&t_start_er, NULL);
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+ TEST_ESP_OK(sdmmc_erase_sectors(card, start_block, block_count, arg));
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+ if (do_sanitize_flag) {
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+ TEST_ESP_OK(sdmmc_mmc_sanitize(card, block_count * 500));
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+ }
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+ struct timeval t_stop_wr;
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+ gettimeofday(&t_stop_wr, NULL);
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+ float time_er = 1e3f * (t_stop_wr.tv_sec - t_start_er.tv_sec) + 1e-3f * (t_stop_wr.tv_usec - t_start_er.tv_usec);
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+ printf(" | %8.2f\n", time_er);
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+
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+ // ensure adjacent blocks are not affected
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+ // block before start_block
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+ if ((flags & FLAG_ERASE_TEST_ADJACENT) && start_block) {
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+ ensure_sector_intact(card, (start_block - 1), pattern_buf, temp_buf);
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+ }
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+
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+ // block after end_block
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+ if ((flags & FLAG_ERASE_TEST_ADJACENT) && (end_block < (card->csd.capacity - 1))) {
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+ ensure_sector_intact(card, (end_block + 1), pattern_buf, temp_buf);
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+ }
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+
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+ uint8_t erase_mem_byte = 0xFF;
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+ // ensure all the blocks are erased and are up to after erase state.
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+ if (!card->is_mmc) {
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+ erase_mem_byte = card->scr.erase_mem_state ? 0xFF : 0x00;
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+ } else {
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+ erase_mem_byte = card->ext_csd.erase_mem_state ? 0xFF : 0x00;
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+ }
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+
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+ memset((void *)pattern_buf, erase_mem_byte, block_size);
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+
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+ // as it is block by block comparison, a time taking process. Really long
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+ // when you do erase and verify on complete device.
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+ if (flags & FLAG_VERIFY_ERASE_STATE) {
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+ for (size_t i = 0; i < block_count; i++) {
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+ if (ensure_sector_erase(card, (start_block + i), pattern_buf, temp_buf)) {
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+ printf("Error: Sector %d erase\n", (start_block + i));
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+ break;
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+ }
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+ }
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+ }
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+
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+ free(temp_buf);
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+ free(pattern_buf);
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+}
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+#endif // WITH_SD_TEST || WITH_EMMC_TEST
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+
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+#if WITH_SDSPI_TEST
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+static void test_sdspi_erase_blocks(size_t start_block, size_t block_count)
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+{
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+ sd_test_board_power_on();
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+ sdmmc_host_t config = SDSPI_HOST_DEFAULT();
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+ sdspi_dev_handle_t handle;
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+ sdspi_device_config_t dev_config = SDSPI_DEVICE_CONFIG_DEFAULT();
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+ dev_config.host_id = config.slot;
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+ dev_config.gpio_cs = SDSPI_TEST_CS_PIN;
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+ test_sdspi_init_bus(dev_config.host_id, SDSPI_TEST_MOSI_PIN, SDSPI_TEST_MISO_PIN, SDSPI_TEST_SCLK_PIN, SPI_DMA_CH_AUTO);
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+ TEST_ESP_OK(sdspi_host_init());
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+ TEST_ESP_OK(sdspi_host_init_device(&dev_config, &handle));
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+
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+ // This test can only run under 20MHz on ESP32, because the runner connects the card to
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+ // non-IOMUX pins of HSPI.
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+
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+ sdmmc_card_t* card = malloc(sizeof(sdmmc_card_t));
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+ TEST_ASSERT_NOT_NULL(card);
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+ TEST_ESP_OK(sdmmc_card_init(&config, card));
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+ sdmmc_card_print_info(stdout, card);
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+ printf("block size %d capacity %d\n", card->csd.sector_size, card->csd.capacity);
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+ printf("Erasing sectors %d-%d\n", start_block, (start_block + block_count -1));
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+ size_t block_size = card->csd.sector_size;
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+ uint8_t *pattern_buf = (uint8_t *)heap_caps_malloc(block_size, MALLOC_CAP_DMA);
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+ TEST_ASSERT_NOT_NULL(pattern_buf);
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+ uint8_t *temp_buf = (uint8_t *)heap_caps_malloc(block_size, MALLOC_CAP_DMA);
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+ TEST_ASSERT_NOT_NULL(temp_buf);
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+
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+ struct timeval t_start_er;
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+ gettimeofday(&t_start_er, NULL);
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+ TEST_ESP_OK(sdmmc_erase_sectors(card, start_block, block_count, SDMMC_ERASE_ARG));
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+ struct timeval t_stop_wr;
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+ gettimeofday(&t_stop_wr, NULL);
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+ float time_er = 1e3f * (t_stop_wr.tv_sec - t_start_er.tv_sec) + 1e-3f * (t_stop_wr.tv_usec - t_start_er.tv_usec);
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+ printf("Erase duration: %.2fms\n", time_er);
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+
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+ // nominal delay before re-init card
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+ vTaskDelay(pdMS_TO_TICKS(1000));
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+ // has to re-init card, after erase operation.
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+ TEST_ESP_OK(sdmmc_card_init(&config, card));
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+ printf("Verifying erase state...\n");
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+ uint8_t erase_mem_byte = 0xFF;
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+ // ensure all the blocks are erased and are up to after erase state.
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+ if (!card->is_mmc) {
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+ erase_mem_byte = card->scr.erase_mem_state ? 0xFF : 0x00;
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+ } else {
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+ erase_mem_byte = card->ext_csd.erase_mem_state ? 0xFF : 0x00;
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+ }
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+
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+ memset((void *)pattern_buf, erase_mem_byte, block_size);
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+
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+ size_t i;
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+ for (i = 0; i < block_count; i++) {
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+ memset((void *)temp_buf, 0, block_size);
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+ TEST_ESP_OK(sdmmc_read_sectors(card, temp_buf, (start_block + i), 1));
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+ if (memcmp(pattern_buf, temp_buf, block_size)) {
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+ printf("Error: Sector %d erase\n", (start_block + i));
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+ break;
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+ }
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+ }
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+ if (i == block_count) {
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+ printf("Sectors erase success\n");
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+ }
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+ TEST_ESP_OK(sdspi_host_deinit());
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+ test_sdspi_deinit_bus(dev_config.host_id);
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+ free(card);
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+ free(temp_buf);
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+ free(pattern_buf);
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+ sd_test_board_power_off();
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+}
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+
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+TEST_CASE("SDMMC erase (SPI mode)", "[sdspi][test_env=UT_T1_SPIMODE]")
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+{
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+ test_sdspi_erase_blocks(0, 16);
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+}
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+#endif // WITH_SDSPI_TEST
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+
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+#if WITH_SD_TEST
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+static void test_sd_erase_blocks(sdmmc_card_t* card)
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+{
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+ sdmmc_card_print_info(stdout, card);
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+ printf("block size %d capacity %d\n", card->csd.sector_size, card->csd.capacity);
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+ printf(" sector | count | size(kB) | er_time(ms) \n");
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+ /*
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+ * bit-0: verify adjacent blocks of given range
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+ * bit-1: verify erase state of blocks in range
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+ */
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+ uint8_t flags = 0;
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+ sdmmc_erase_arg_t arg = SDMMC_ERASE_ARG;
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+
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+ //check for adjacent blocks and erase state of blocks
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+ flags |= (uint8_t)FLAG_ERASE_TEST_ADJACENT | (uint8_t)FLAG_VERIFY_ERASE_STATE;
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+ do_single_erase_test(card, 1, 16, flags, arg);
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+ do_single_erase_test(card, 1, 13, flags, arg);
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+ do_single_erase_test(card, 16, 32, flags, arg);
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+ do_single_erase_test(card, 48, 64, flags, arg);
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+ do_single_erase_test(card, 128, 128, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity - 64, 32, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity - 64, 64, flags, arg);
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+ // single sector erase is failing on different make cards
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+ do_single_erase_test(card, card->csd.capacity - 8, 1, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 1, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 4, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 8, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 16, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 32, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 64, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 128, flags, arg);
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+#ifdef SDMMC_FULL_ERASE_TEST
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+ /*
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+ * check for adjacent blocks, do not check erase state of blocks as it is
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+ * time taking process to verify all the blocks.
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+ */
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+ flags &= ~(uint8_t)FLAG_VERIFY_ERASE_STATE; //comment this line to verify after-erase state
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+ // erase complete card
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+ do_single_erase_test(card, 0, card->csd.capacity, flags, arg);
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+#endif //SDMMC_FULL_ERASE_TEST
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+}
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+
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+TEST_CASE("SDMMC erase test (SD slot 1, 1 line)", "[sd][test_env=UT_T1_SDMODE]")
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+{
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+ sd_test_board_power_on();
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+ sd_test_rw_blocks(1, 1, test_sd_erase_blocks);
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+ sd_test_board_power_off();
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+}
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+
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+TEST_CASE("SDMMC erase test (SD slot 1, 4 line)", "[sd][test_env=UT_T1_SDMODE]")
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+{
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+ sd_test_board_power_on();
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+ sd_test_rw_blocks(1, 4, test_sd_erase_blocks);
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+ sd_test_board_power_off();
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+}
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+#endif //WITH_SD_TEST
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+
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+#if WITH_EMMC_TEST
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+static void test_mmc_sanitize_blocks(sdmmc_card_t* card)
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+{
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+ /* MMC dicard applies to write blocks */
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+ sdmmc_card_print_info(stdout, card);
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+ printf("block size %d capacity %d\n", card->csd.sector_size, card->csd.capacity);
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+
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+ if (sdmmc_mmc_can_sanitize(card)) {
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+ printf("Card/device do not support sanitize\n");
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+ return;
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+ }
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+ printf(" sector | count | size(kB) | er_time(ms) \n");
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+ /*
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+ * bit-0: verify adjacent blocks of given range
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+ * bit-1: verify erase state of blocks in range
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+ */
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+ uint8_t flags = 0;
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+ sdmmc_erase_arg_t arg = SDMMC_DISCARD_ARG;
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+ do_sanitize_flag = true;
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+
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+ /*
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+ * Check for adjacent blocks only.
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+ * After discard operation, the original data may be remained partially or
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+ * fully accessible to the host dependent on device. Hence do not verify
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+ * the erased state of the blocks.
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+ *
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+ * Note: After sanitize blocks has to be in erased state
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+ */
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+ flags |= (uint8_t)FLAG_ERASE_TEST_ADJACENT | (uint8_t)FLAG_VERIFY_ERASE_STATE;
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+ do_single_erase_test(card, 1, 16, flags, arg);
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+ do_single_erase_test(card, 1, 13, flags, arg);
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+ do_single_erase_test(card, 16, 32, flags, arg);
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+ do_single_erase_test(card, 48, 64, flags, arg);
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+ do_single_erase_test(card, 128, 128, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity - 64, 32, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity - 64, 64, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity - 8, 1, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 1, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 4, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 8, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 16, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 32, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 64, flags, arg);
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+ do_single_erase_test(card, card->csd.capacity/2, 128, flags, arg);
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+ do_sanitize_flag = false;
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+}
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+
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+static void test_mmc_discard_blocks(sdmmc_card_t* card)
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+{
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+ /* MMC dicard applies to write blocks */
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+ sdmmc_card_print_info(stdout, card);
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+ printf("block size %d capacity %d\n", card->csd.sector_size, card->csd.capacity);
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+ printf(" sector | count | size(kB) | er_time(ms) \n");
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+ /*
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+ * bit-0: verify adjacent blocks of given range
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+ * bit-1: verify erase state of blocks in range
|
|
|
+ */
|
|
|
+ uint8_t flags = 0;
|
|
|
+ sdmmc_erase_arg_t arg = SDMMC_DISCARD_ARG;
|
|
|
+
|
|
|
+ /*
|
|
|
+ * Check for adjacent blocks only.
|
|
|
+ * After discard operation, the original data may be remained partially or
|
|
|
+ * fully accessible to the host dependent on device. Hence do not verify
|
|
|
+ * the erased state of the blocks.
|
|
|
+ */
|
|
|
+ flags |= (uint8_t)FLAG_ERASE_TEST_ADJACENT;
|
|
|
+ do_single_erase_test(card, 1, 16, flags, arg);
|
|
|
+ do_single_erase_test(card, 1, 13, flags, arg);
|
|
|
+ do_single_erase_test(card, 16, 32, flags, arg);
|
|
|
+ do_single_erase_test(card, 48, 64, flags, arg);
|
|
|
+ do_single_erase_test(card, 128, 128, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity - 64, 32, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity - 64, 64, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity - 8, 1, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 1, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 4, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 8, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 16, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 32, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 64, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 128, flags, arg);
|
|
|
+}
|
|
|
+
|
|
|
+static void test_mmc_trim_blocks(sdmmc_card_t* card)
|
|
|
+{
|
|
|
+ /* MMC trim applies to write blocks */
|
|
|
+ sdmmc_card_print_info(stdout, card);
|
|
|
+ printf("block size %d capacity %d\n", card->csd.sector_size, card->csd.capacity);
|
|
|
+ printf(" sector | count | size(kB) | er_time(ms) \n");
|
|
|
+ /*
|
|
|
+ * bit-0: verify adjacent blocks of given range
|
|
|
+ * bit-1: verify erase state of blocks in range
|
|
|
+ */
|
|
|
+ uint8_t flags = 0;
|
|
|
+ sdmmc_erase_arg_t arg = SDMMC_ERASE_ARG;
|
|
|
+
|
|
|
+ //check for adjacent blocks and erase state of blocks
|
|
|
+ flags |= (uint8_t)FLAG_ERASE_TEST_ADJACENT | (uint8_t)FLAG_VERIFY_ERASE_STATE;
|
|
|
+ do_single_erase_test(card, 1, 16, flags, arg);
|
|
|
+ do_single_erase_test(card, 1, 13, flags, arg);
|
|
|
+ do_single_erase_test(card, 16, 32, flags, arg);
|
|
|
+ do_single_erase_test(card, 48, 64, flags, arg);
|
|
|
+ do_single_erase_test(card, 128, 128, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity - 64, 32, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity - 64, 64, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity - 8, 1, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 1, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 4, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 8, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 16, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 32, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 64, flags, arg);
|
|
|
+ do_single_erase_test(card, card->csd.capacity/2, 128, flags, arg);
|
|
|
+#ifdef SDMMC_FULL_ERASE_TEST
|
|
|
+ /*
|
|
|
+ * check for adjacent blocks, do not check erase state of blocks as it is
|
|
|
+ * time taking process to verify all the blocks.
|
|
|
+ */
|
|
|
+ flags &= ~(uint8_t)FLAG_VERIFY_ERASE_STATE; //comment this line to verify after erase state
|
|
|
+ // erase complete card
|
|
|
+ do_single_erase_test(card, 0, card->csd.capacity, flags, arg);
|
|
|
+#endif //SDMMC_FULL_ERASE_TEST
|
|
|
+}
|
|
|
+
|
|
|
+TEST_CASE("SDMMC trim test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC]")
|
|
|
+{
|
|
|
+ sd_test_board_power_on();
|
|
|
+ sd_test_rw_blocks(0, 4, test_mmc_trim_blocks);
|
|
|
+ sd_test_board_power_off();
|
|
|
+}
|
|
|
+
|
|
|
+TEST_CASE("SDMMC trim test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]")
|
|
|
+{
|
|
|
+ sd_test_board_power_on();
|
|
|
+ sd_test_rw_blocks(0, 8, test_mmc_trim_blocks);
|
|
|
+ sd_test_board_power_off();
|
|
|
+}
|
|
|
+
|
|
|
+TEST_CASE("SDMMC discard test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC]")
|
|
|
+{
|
|
|
+ sd_test_board_power_on();
|
|
|
+ sd_test_rw_blocks(0, 4, test_mmc_discard_blocks);
|
|
|
+ sd_test_board_power_off();
|
|
|
+}
|
|
|
+
|
|
|
+TEST_CASE("SDMMC discard test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]")
|
|
|
+{
|
|
|
+ sd_test_board_power_on();
|
|
|
+ sd_test_rw_blocks(0, 8, test_mmc_discard_blocks);
|
|
|
+ sd_test_board_power_off();
|
|
|
+}
|
|
|
+
|
|
|
+TEST_CASE("SDMMC sanitize test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC]")
|
|
|
+{
|
|
|
+ sd_test_board_power_on();
|
|
|
+ sd_test_rw_blocks(0, 4, test_mmc_sanitize_blocks);
|
|
|
+ sd_test_board_power_off();
|
|
|
+}
|
|
|
+
|
|
|
+TEST_CASE("SDMMC sanitize test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]")
|
|
|
+{
|
|
|
+ sd_test_board_power_on();
|
|
|
+ sd_test_rw_blocks(0, 8, test_mmc_sanitize_blocks);
|
|
|
+ sd_test_board_power_off();
|
|
|
+}
|
|
|
+#endif //WITH_EMMC_TEST
|