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adc_dma_test
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d90e0e4345
driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver.
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5 лет назад |
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dac_dma_test
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b35d9002f3
driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug.
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5 лет назад |
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include
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f6dd63d03d
spi_slave_hd: new driver for spi slave in half duplex mode
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5 лет назад |
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param_test
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50aad77f3a
driver: Rename "local" tests to "single board" tests, add some description to the names
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6 лет назад |
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touch_sensor_test
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75212b5055
ut: fix touch sensor denoise ci fail
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5 лет назад |
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CMakeLists.txt
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8256b5f32b
driver(adc): fix adc io init bug; add unit test to check;
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5 лет назад |
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component.mk
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8256b5f32b
driver(adc): fix adc io init bug; add unit test to check;
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5 лет назад |
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test_adc2_with_wifi.c
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baa7898e35
driver(adc/dac): fix adc dac driver for esp32s2
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5 лет назад |
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test_adc_common.c
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d90e0e4345
driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver.
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5 лет назад |
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test_common_spi.c
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11fa11000f
spi: re-enable the unit tests for esp32s2beta
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6 лет назад |
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test_dac.c
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406b8f423d
driver(adc): add adc initial code before app_main for esp32s2.
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5 лет назад |
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test_gpio.c
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a4d0033c03
esp_rom: extract common GPIO apis into esp_rom_gpio.h
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5 лет назад |
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test_i2c.c
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a4d0033c03
esp_rom: extract common GPIO apis into esp_rom_gpio.h
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5 лет назад |
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test_i2s.c
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a4d0033c03
esp_rom: extract common GPIO apis into esp_rom_gpio.h
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5 лет назад |
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test_ledc.c
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d16ad4a67a
ci: disable case witout runners
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6 лет назад |
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test_pcnt.c
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a4d0033c03
esp_rom: extract common GPIO apis into esp_rom_gpio.h
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5 лет назад |
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test_pwm.c
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4220752aed
ut: Move tests back from "esp32" subfolder
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6 лет назад |
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test_rmt.c
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a4d0033c03
esp_rom: extract common GPIO apis into esp_rom_gpio.h
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5 лет назад |
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test_rs485.c
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983220e216
ci: temporarily disable RS485 related tests
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5 лет назад |
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test_rtcio.c
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0c2bf7c8bc
rtcio: add hal for driver
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6 лет назад |
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test_sdio.c
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f10a721d88
sdio: fix the unit of performance test
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5 лет назад |
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test_sdmmc_sdspi_init.cpp
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067f3d21c9
sdspi, vfs_fat: allow sharing SPI bus among devices, and mounting multiple SD cards
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6 лет назад |
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test_sigmadelta.c
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de848a5150
test: driver/sigmadelta test case
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7 лет назад |
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test_spi_bus_lock.c
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fdf983e0c4
spi: fix config break and reduce overhead of the bus lock on SPI1
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5 лет назад |
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test_spi_master.c
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a50ea8ad55
spi: allow force pins being configured throug GPIO matrix
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5 лет назад |
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test_spi_param.c
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3bb41fd67e
spi: add unit test for slave receiving length
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6 лет назад |
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test_spi_sio.c
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e30cd361a8
global: rename esp32s2beta to esp32s2
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6 лет назад |
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test_spi_slave.c
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a4d0033c03
esp_rom: extract common GPIO apis into esp_rom_gpio.h
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5 лет назад |
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test_spi_slave_hd.c
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f6dd63d03d
spi_slave_hd: new driver for spi slave in half duplex mode
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5 лет назад |
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test_timer.c
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cb4ed98df7
bugfix(timer): improve timer unit test case
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5 лет назад |
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test_uart.c
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289ad82bc0
driver test: Ensure uart write task can't overflow buffer of read task
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5 лет назад |
Michael (XIAO Xufeng)
f8f2f7c297
Merge branch 'bugfix/touch_sensor_denoise_ci_for_esp32s2' into 'master'