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components
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47c2c13de5
build: Adds support for universal Clang toolchain
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3 anos atrás |
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dac_test_apps
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2cccf3a804
dac: update API and file format aligning to the rule
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3 anos atrás |
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gpio
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d5b4108085
gpio: combine sdm, glitch filter, fast gpio tests into one app
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3 anos atrás |
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gpio_extensions
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d5b4108085
gpio: combine sdm, glitch filter, fast gpio tests into one app
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3 anos atrás |
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gptimer
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bc2a2d3cde
gptimer: support RC_FAST clock source
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3 anos atrás |
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i2s_test_apps
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705ddd221f
test more freq
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3 anos atrás |
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ledc
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774197b7d3
ledc: Move ledc unit test to test_apps pytest framework
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3 anos atrás |
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legacy_adc_driver
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5333ac81bf
adc: support ADC on esp32c6 (driver/test/example)
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3 anos atrás |
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legacy_mcpwm_driver
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c6e452a871
mcpwm: enable test on esp32c6
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3 anos atrás |
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legacy_pcnt_driver
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4e8eb6864e
pcnt: Re-enable legacy pcnt test for esp32c6 (ledc support completed)
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3 anos atrás |
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legacy_rmt_driver
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32cd193ddf
rmt: support pll clock source on esp32c6
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3 anos atrás |
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legacy_rtc_temp_driver
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7466ddfa8c
ci: Make consistence between pytest_*.py and .build-test-rules.yml for esp32c6 (i.e. to pass check_test_scripts_build_test_rules.py)
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3 anos atrás |
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legacy_timer_driver
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bc2a2d3cde
gptimer: support RC_FAST clock source
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3 anos atrás |
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mcpwm
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c6e452a871
mcpwm: enable test on esp32c6
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3 anos atrás |
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pulse_cnt
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2557e24a28
ci: Enable esp32c6 example, test_apps, and unit tests CI build stage
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3 anos atrás |
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rmt
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32cd193ddf
rmt: support pll clock source on esp32c6
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3 anos atrás |
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rs485
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76ddc2b8a7
test: move rs485 test to test_app
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3 anos atrás |
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sdio
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720b86a886
example/sdio: add support for ESP32-S3 as host (via SD)
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3 anos atrás |
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spi
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dd50bb2d50
test: enable multi-board test of spi for c6
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3 anos atrás |
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temperature_sensor
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7466ddfa8c
ci: Make consistence between pytest_*.py and .build-test-rules.yml for esp32c6 (i.e. to pass check_test_scripts_build_test_rules.py)
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3 anos atrás |
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touch_sensor_v1
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045b65e85d
touch_senser: fixed ci issue timer expired after it is deleted
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3 anos atrás |
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touch_sensor_v2
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6ca1db3ef2
touch_sensor: fix touch_sensor_v1 filter issue
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3 anos atrás |
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twai
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a83165fea0
twai: add initial version of driver component test
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3 anos atrás |
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uart
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fb7d8f49be
test: move uart test to test_app
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3 anos atrás |
morris
d5b4108085
gpio: combine sdm, glitch filter, fast gpio tests into one app