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dac_dma_test
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5b523a3313
esp_adc: new esp_adc component and adc drivers
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%!s(int64=3) %!d(string=hai) anos |
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include
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5b523a3313
esp_adc: new esp_adc component and adc drivers
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%!s(int64=3) %!d(string=hai) anos |
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param_test
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58f79e6b00
driver: update copyright notice
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CMakeLists.txt
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5e4ab6481f
touch_sensor: move unit tests to test_app
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test_common_spi.c
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fe9c6cde4f
spi: support spi on h2
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test_dac.c
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5b523a3313
esp_adc: new esp_adc component and adc drivers
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%!s(int64=3) %!d(string=hai) anos |
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test_i2c.c
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5b3468ebb3
i2c: support i2c on esp32h2
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%!s(int64=3) %!d(string=hai) anos |
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test_ledc.c
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0445c87459
ledc: Fix the usage of ledc_ls_timer_update and ledc_timer_rst
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%!s(int64=3) %!d(string=hai) anos |
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test_rs485.c
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c78f126eed
driver: uart rs485 fix test sync issues and fail threshold
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test_rtcio.c
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57fd78f5ba
freertos: Remove legacy data types
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test_sdio.c
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708e99497b
global: add dependency on esp_timer component and include esp_timer.h
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test_sdmmc_sdspi_init.cpp
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384d61f156
remove: sdspi_host deprecated api
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test_spi_bus_lock.c
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6a8aed12ee
ci: partially enable ut tests for esp32c2
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test_spi_master.c
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6005cc9163
hal: Deprecate interrupt_controller_hal.h, cpu_hal.h and cpu_ll.h interfaces
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%!s(int64=3) %!d(string=hai) anos |
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test_spi_param.c
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5d24a207b6
test_spi: fixed redundant quotes in test descriptions
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test_spi_sio.c
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0f92a706ba
spi_master: change sio test communication bringup flow to fix testcase failure
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test_spi_slave.c
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6a8aed12ee
ci: partially enable ut tests for esp32c2
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%!s(int64=3) %!d(string=hai) anos |
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test_spi_slave_hd.c
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6a8aed12ee
ci: partially enable ut tests for esp32c2
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%!s(int64=3) %!d(string=hai) anos |
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test_uart.c
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9d73475e44
uart: Add a new API to get the free space size of tx buffer
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Wan Lei
c5b094a96f
Merge branch 'test/fix_sio_mode_multi_test_faile' into 'master'